Development of high-density RF board diagnostic program

dc.contributorHao, Qi
dc.contributorMewes, Tim
dc.contributor.advisorKim, Bruce C.
dc.contributor.authorKannan, Sukeshwar
dc.contributor.otherUniversity of Alabama Tuscaloosa
dc.date.accessioned2017-02-28T22:30:36Z
dc.date.available2017-02-28T22:30:36Z
dc.date.issued2010
dc.descriptionElectronic Thesis or Dissertationen_US
dc.description.abstractThis thesis describes the development and application of a software tool. RF Analyzer and Diagnostic Program Generation Tool (RADPro) has been developed to automate the process of testing the RF Device Interface Boards (DIB). DIBs are essential components for testing ICs and they contain mixed-signal and RF circuits with several active and passive components that are needed to simulate test conditions for ICs. A new integrated software environment has been developed to automatically generate functional tests for board verification. This software environment utilizes the schematic information, DIB-specific constraints, accessibility provided by the test hardware and instrument automation tools to generate a functional test program. The output of the tool is a generic test specification that is independent of test hardware platform. RADPro has been developed for testing RF DIBs at Texas Instruments Inc. Test execution has been performed on several RF DIBs and the test results have been recorded in the pseudocode format as well as look up table which provides a detailed analysis of all possible faults that can occur in the passive components. Complete automation of DIB test methodology implementation has been presented in this thesis. Automatic test generation by RADPro reduces design expenses and time to market significantly in comparison with the existing techniques. The testing methodology presented in this thesis produces the pseudocode for automating the test procedure on Very Low Cost Tester (VLCT) systems.en_US
dc.format.extent74 p.
dc.format.mediumelectronic
dc.format.mimetypeapplication/pdf
dc.identifier.otheru0015_0000001_0000350
dc.identifier.otherKannan_alatus_0004M_10393
dc.identifier.urihttps://ir.ua.edu/handle/123456789/856
dc.languageEnglish
dc.language.isoen_US
dc.publisherUniversity of Alabama Libraries
dc.relation.hasversionborn digital
dc.relation.ispartofThe University of Alabama Electronic Theses and Dissertations
dc.relation.ispartofThe University of Alabama Libraries Digital Collections
dc.rightsAll rights reserved by the author unless otherwise indicated.en_US
dc.subjectEngineering, Electronics and Electrical
dc.titleDevelopment of high-density RF board diagnostic programen_US
dc.typethesis
dc.typetext
etdms.degree.departmentUniversity of Alabama. Department of Electrical and Computer Engineering
etdms.degree.disciplineElectrical and Computer Engineering
etdms.degree.grantorThe University of Alabama
etdms.degree.levelmaster's
etdms.degree.nameM.S.
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