The FePt L10 Phase Transformation in Thin Films using Multiple Laser Pulsing

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dc.contributor.authorInaba, Yuki
dc.contributor.authorThompson, Gregory B.
dc.contributor.authorHarrell, J. W.
dc.contributor.authorKlemmer, Tim
dc.contributor.authorKubota, Yukiko
dc.contributor.otherUniversity of Alabama Tuscaloosa
dc.date.accessioned2018-11-12T21:02:14Z
dc.date.available2018-11-12T21:02:14Z
dc.date.issued2010-03-04
dc.description.abstractA series of ≈12 nm thick FePt thin films deposited onto glass substrates have been annealed with multiple 1064 nm wavelength laser pulses. The fluence was varied using pulse widths of 10.0, 5.0, and 2.5 ms. The peak temperature for each individual pulse was kept near 700 °C. The A1 to L10 phase transformation was confirmed by x-ray diffraction. A single pulse was not sufficient to obtain a fully ordered state. A maximum order parameter of 0.89 and coercivity of 10.6 kOe was obtained after 5×10 ms pulses. This particular annealed film showed the greatest amount of grain growth with a mean size of 55.1 nm. This grain size is 20% smaller than that of a furnace annealed sample which was annealed for 60 s and yielded an approximately equivalent order parameter. Similar order parameters, grain sizes, and coercivity values were observed for films that had equivalent total annealing times regardless of pulse widths.en_US
dc.format.mimetypeapplication/pdf
dc.identifier.citationInaba, Y., et al. (2010): The FePt L10 Phase Transformation in Thin Films using Multiple Laser Pulsing. Journal of Applied Physics, 107(5).
dc.identifier.urihttp://ir.ua.edu/handle/123456789/4864
dc.subjectMagnetic hysteresis
dc.subjectCrystallography
dc.subjectAnnealing
dc.subjectGlass
dc.subjectX-ray diffraction
dc.subjectThin films
dc.subjectLasers
dc.subjectPhase transitions
dc.subjectSuperlattices
dc.subjectCrystallographic defects
dc.titleThe FePt L10 Phase Transformation in Thin Films using Multiple Laser Pulsingen_US
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