Time-Temperature-Transformation Measurements of FePt Thin Films in the Millisecond Regime Using Pulse Laser Processing

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dc.contributor.authorInaba, Yuki
dc.contributor.authorZana, Iulica
dc.contributor.authorSwartz, Caleb
dc.contributor.authorKubota, Yukiko
dc.contributor.authorKlemmer, Tim
dc.contributor.authorHarrell, J. W.
dc.contributor.authorThompson, Gregory B.
dc.contributor.otherUniversity of Alabama Tuscaloosa
dc.date.accessioned2018-11-12T20:50:25Z
dc.date.available2018-11-12T20:50:25Z
dc.date.issued2010-11-19
dc.description.abstractA section of the time-temperature-transformation TTT curve has been measured in the millisecond regime to describe the A1 to L10 transformation of 10 nm FePt thin films. Short time annealing was accomplished using a pulsed neodymium-doped yttrium aluminum garnet laser operating at a wavelength of 1064 nm. The temperature-time profile of the films was measured using an optical pyrometer and a platinum thin film resistor and it was numerically modeled. Effective thermal pulse widths were determined from the time dependence of the atomic diffusion coefficient calculated from the measured temperature profile. The measured TTT diagram involving average order parameter is consistent with theoretical predictions of TTT diagrams involving ordered volume fraction and shows that partial ordering can be obtained with a single effective thermal pulse as short as 1.1 ms.en_US
dc.format.mimetypeapplication/pdf
dc.identifier.citationInaba, Y., et al. (2010): Time-Temperature-Transformation Measurements of FePt Thin Films in the Millisecond Regime Using Pulse Laser Processing. Journal of Applied Physics, 108(10).
dc.identifier.urihttp://ir.ua.edu/handle/123456789/4862
dc.subjectCrystallography
dc.subjectAnnealing
dc.subjectTransition metals
dc.subjectEnergy dispersive X-ray spectroscopy
dc.subjectThermal instruments
dc.subjectThin films
dc.subjectChemical elements
dc.subjectLaser materials processing
dc.subjectPhase transitions
dc.subjectThermodynamic states and processes
dc.titleTime-Temperature-Transformation Measurements of FePt Thin Films in the Millisecond Regime Using Pulse Laser Processingen_US

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