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Detection of Higher Order Modulation Harmonics in Magnetic Resonance Force Microscopy

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dc.contributor.authorMewes, T.
dc.contributor.authorMewes, C. K. A.
dc.contributor.authorNazaretski, E.
dc.contributor.authorKim, J.
dc.contributor.authorFong, K. C.
dc.contributor.authorObukhov, Y.
dc.contributor.authorPelekhov, D. V.
dc.contributor.authorWigen, P. E.
dc.contributor.authorHammel, P. C.
dc.contributor.otherUniversity of Alabama Tuscaloosa
dc.date.accessioned2018-08-29T20:15:06Z
dc.date.available2018-08-29T20:15:06Z
dc.date.issued2007
dc.description.abstractMagnetic resonance force microscopy measurements of the electron spin resonance of a thin film of 2,2-diphenyl-1-picrylhydrazyl were performed using a low doped silicon cantilever with a high coercivity SmCo particle glued to its end. The low doping level enables amplitude modulation of the microwave field with only small spurious driving of the cantilever. Besides amplitude modulation we use frequency modulation of the microwave field at integer fractions of the cantilever resonance frequency leading to derivative signals up to the fourth derivative of the amplitude modulation response signal. The influence of the modulation depth on the line shape of the first derivative response is also presented.en_US
dc.format.mimetypeapplication/pdf
dc.identifier.citationMewes, T., et al. (2007): Detection of Higher Order Modulation Harmonics in Magnetic Resonance Force Microscopy, Journal of Applied Physics, 102(3).
dc.identifier.urihttp://ir.ua.edu/handle/123456789/3792
dc.subjectLinewidths
dc.subjectDoping
dc.subjectMagnetic resonance
dc.subjectElectron microscopy
dc.subjectVibration resonance
dc.subjectAtomic line shapes
dc.subjectFrequency modulation
dc.subjectElectron paramagnetic resonance spectroscopy
dc.subjectMicrowaves
dc.subjectMagnetic fields
dc.titleDetection of Higher Order Modulation Harmonics in Magnetic Resonance Force Microscopyen_US
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