Automatic test program generation and novel test techniques for testing radio frequency and high-voltage device interface boards
This dissertation describes the development and application of two software tools: RF Analyzer and Diagnostic Program Generation (RADPro), and High-Voltage Program Generation (HVPro). We developed these tools to automate the process of testing device interface boards for production testing of IC chips. Testing device interface board is an essential part of a production testing to ensure all components on the board are assembled properly and operational before the actual IC chips can be tested. Our software tools utilize the netlist, bill of materials and component model library. Automatic test program generation by RADPro and HVPro reduces design expense and time to market a new IC product significantly by reducing manual handcoding work. We have validated some of our pseudocode with the existing automatic test equipment at Texas Instruments, Inc.