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The growth temperature and measurement temperature dependences of soft magnetic properties and effective damping parameter of (FeCo)-Al alloy thin films

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dc.contributor.authorAriake, Yusuke
dc.contributor.authorWu, Shuang
dc.contributor.authorKanada, Isao
dc.contributor.authorMewes, Tim
dc.contributor.authorTanaka, Yoshitomo
dc.contributor.authorMankey, Gary
dc.contributor.authorMewes, Claudia
dc.contributor.authorSuzuki, Takao
dc.contributor.otherUniversity of Alabama Tuscaloosa
dc.contributor.otherTDK Corporation
dc.date.accessioned2019-07-22T21:47:53Z
dc.date.available2019-07-22T21:47:53Z
dc.date.issued2018-01-05
dc.description.abstractThe soft magnetic properties and effective damping parameters of Fe73Co25Al2 alloy thin films are discussed. The effective damping parameter alpha(eff) measured by ferromagnetic resonance for the 10 nm-thick sample is nearly constant (approximate to 0.004 +/- 0.0008) for a growth temperature T-s from ambient to 200 degrees C, and then tends to decrease for higher temperatures and alpha(eff) is 0.002 +/- 0.0004 at T-s = 300 degrees C. For the 80 nm-thick sample, the alpha(eff) seems to increase with T-s from alpha(eff) = 0.001 +/- 0.0002 at T-s = ambient to alpha(eff) = 0.002 +/- 0.0004. The alpha(eff) is found nearly constant (alpha(eff) = 0.004 +/- 0.0008) over a temperature range from 10 to 300 K for the 10 nm films with the different T-s (ambient, 100 and 200 degrees C). Together with an increasing non-linearity of the frequency dependence of the linewidth at low Ts, extrinsic contributions such as two-magnon scattering dominate the observed temperature dependence of effective damping and linewidth. (C) 2018 Author(s).en_US
dc.format.mimetypeapplication/pdf
dc.identifier.citationAriake, Y., et al. (2018): The Growth Temperature and Measurement Temperature Dependences of Soft Magnetic Properties and Effective Damping Parameter of (FeCo)-Al Alloy Thin Films. AIP Advances, 8(5). DOI: https://doi.org/10.1063/1.5007744
dc.identifier.doi10.1063/1.5007744
dc.identifier.orcidhttps://orcid.org/0000-0001-9954-884X
dc.identifier.orcidhttps://orcid.org/0000-0003-3163-5159
dc.identifier.orcidhttps://orcid.org/0000-0001-6166-9427
dc.identifier.urihttp://ir.ua.edu/handle/123456789/6014
dc.languageEnglish
dc.language.isoen_US
dc.publisherAmerican Institute of Physics
dc.subjectNanoscience & Nanotechnology
dc.subjectMaterials Science, Multidisciplinary
dc.subjectPhysics, Applied
dc.subjectScience & Technology - Other Topics
dc.subjectMaterials Science
dc.subjectPhysics
dc.titleThe growth temperature and measurement temperature dependences of soft magnetic properties and effective damping parameter of (FeCo)-Al alloy thin filmsen_US
dc.typetext
dc.typeArticle
dc.typeProceedings Paper

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