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Calibration of magnetic force microscopy using micron size straight current wires

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dc.contributor.authorLiu, CX
dc.contributor.authorLin, K
dc.contributor.authorHolmes, R
dc.contributor.authorMankey, GJ
dc.contributor.authorFujiwara, H
dc.contributor.authorJiang, HM
dc.contributor.authorCho, HS
dc.contributor.otherUniversity of Alabama Tuscaloosa
dc.contributor.otherSeagate Technology
dc.date.accessioned2019-07-12T16:43:10Z
dc.date.available2019-07-12T16:43:10Z
dc.date.issued2002-05-13
dc.description.abstractA circuit with two long parallel micron size wires was fabricated by photolithography to calibrate magnetic force microscopy (MFM) tips. The tip phase shift increased as the tip scan height decreased. With the tip scan height kept constant, a linear relationship was found between the current amplitude and the phase shift of the tip at the center position of the two wires separation. The estimated magnetic moment of the tip was one order larger than its nominal value. The results imply that with better control over the fabrication process, the micron size straight wires can be used to calibrate MFM tips. (C) 2002 American Institute of Physics.en_US
dc.format.mimetypeapplication/pdf
dc.identifier.citationLiu, C., et al. (2002): Calibration of Magnetic Force Microscopy using Micron Size Straight Current Wires. Journal of Applied Physics, 91(10). DOI: https://doi.org/10.1063/1.1456058
dc.identifier.doi10.1063/1.1456058
dc.identifier.orcidhttps://orcid.org/0000-0003-3163-5159
dc.identifier.orcidhttps://orcid.org/0000-0003-3163-5159
dc.identifier.urihttp://ir.ua.edu/handle/123456789/5951
dc.languageEnglish
dc.language.isoen_US
dc.publisherAmerican Institute of Physics
dc.subjectPhysics, Applied
dc.subjectPhysics
dc.titleCalibration of magnetic force microscopy using micron size straight current wiresen_US
dc.typetext
dc.typeArticle
dc.typeProceedings Paper

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