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Correlation of low energy electrical measurements with the second breakdown characteristics of semiconductor devices

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dc.contributor.authorFriday, Edward Carney
dc.contributor.otherUniversity of Alabama Tuscaloosa
dc.date.accessioned2022-01-04T20:00:26Z
dc.date.available2022-01-04T20:00:26Z
dc.date.issued1973
dc.descriptionElectronic Thesis or Dissertationen_US
dc.format.extent90 leaves
dc.format.mediumelectronic
dc.format.mimetypeapplication/pdf
dc.identifier.urihttp://ir.ua.edu/handle/123456789/8229
dc.languageEnglish
dc.language.isoen_US
dc.publisherUniversity of Alabama Libraries
dc.relation.ispartofThe University of Alabama Electronic Theses and Dissertations
dc.relation.ispartofThe University of Alabama Libraries Digital Collections
dc.rightsAll rights reserved by the author unless otherwise indicated.en_US
dc.subjectElectric measurements
dc.subjectSemiconductors
dc.titleCorrelation of low energy electrical measurements with the second breakdown characteristics of semiconductor devicesen_US
dc.typethesis
dc.typetext
etdms.degree.departmentUniversity of Alabama. Department of Electrical and Computer Engineering
etdms.degree.disciplineElectrical and Computer Engineering
etdms.degree.grantorThe University of Alabama
etdms.degree.levelmaster's
etdms.degree.nameM.S.

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Theses and Dissertations - Department of Electrical & Computer Engineering (ECE)