Influence of Surface Roughness on Secondary Electron Emission from Graphite

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dc.contributor.author Burton, Thomas S.
dc.contributor.author Back, Tyson C.
dc.contributor.author Fairchild, Steven B.
dc.contributor.author Thompson, Gregory B.
dc.date.accessioned 2018-11-12T21:53:30Z
dc.date.available 2018-11-12T21:53:30Z
dc.date.issued 2017-06-15
dc.identifier.citation Burton, T., et al. (2017): Influence of Surface Roughness on Secondary Electron Emission from Graphite. Journal of Vacuum Science & Technology, 35. en_US
dc.identifier.uri http://ir.ua.edu/handle/123456789/4873
dc.description.abstract In this study, the authors address how surface roughness alters secondary electron emission. By using specific grades of metallographic polishing pads, controlled levels of roughness and surface features were imparted. As expected, the smoothest surface (root mean square roughness 0.110 ± 0.022 μm) produced the highest secondary electron yield; however, a moderate rough surface (0.990 ± 0.019 μm) produced a slightly lower yield as compared to a rougher surface (7.10 ± 1.23 μm) at lower primary electron energies. This inversion, that a macroscopic rougher surface yields a higher emission, has been explained by differences between large and small scale variations in the surface roughness and the frequency that these features appeared on the surface. The surface roughness was quantified using optical profilometry and a fast Fourier transform of the surface topology. en_US
dc.format.mimetype application/pdf en_US
dc.subject Optical imaging en_US
dc.subject Emission coefficient en_US
dc.subject Carbides en_US
dc.subject Fourier analysis en_US
dc.subject Microscopy en_US
dc.subject Transition metals en_US
dc.subject Carbon based materials en_US
dc.subject Profilometry en_US
dc.subject Electron traps en_US
dc.subject Surface collisions en_US
dc.title Influence of Surface Roughness on Secondary Electron Emission from Graphite en_US
dc.type text en_US


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