Abstract:
A series of ≈12 nm thick FePt thin films deposited onto glass substrates have been annealed with multiple 1064 nm wavelength laser pulses. The fluence was varied using pulse widths of 10.0, 5.0, and 2.5 ms. The peak temperature for each individual pulse was kept near 700 °C. The A1 to L10 phase transformation was confirmed by x-ray diffraction. A single pulse was not sufficient to obtain a fully ordered state. A maximum order parameter of 0.89 and coercivity of 10.6 kOe was obtained after 5×10 ms pulses. This particular annealed film showed the greatest amount of grain growth with a mean size of 55.1 nm. This grain size is 20% smaller than that of a furnace annealed sample which was annealed for 60 s and yielded an approximately equivalent order parameter. Similar order parameters, grain sizes, and coercivity values were observed for films that had equivalent total annealing times regardless of pulse widths.
