Abstract:
A section of the time-temperature-transformation TTT curve has been measured in the millisecond
regime to describe the A1 to L10 transformation of 10 nm FePt thin films. Short time annealing was
accomplished using a pulsed neodymium-doped yttrium aluminum garnet laser operating at a
wavelength of 1064 nm. The temperature-time profile of the films was measured using an optical
pyrometer and a platinum thin film resistor and it was numerically modeled. Effective thermal pulse
widths were determined from the time dependence of the atomic diffusion coefficient calculated
from the measured temperature profile. The measured TTT diagram involving average order
parameter is consistent with theoretical predictions of TTT diagrams involving ordered volume
fraction and shows that partial ordering can be obtained with a single effective thermal pulse as short
as 1.1 ms.
