Orientation-dependent surface potential behavior in Nb-doped BiFeO3

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dc.contributor.author Yan, F.
dc.contributor.author Xing, G. Z.
dc.contributor.author Islam, M.
dc.contributor.author Li, S.
dc.contributor.author Lu, L.
dc.date.accessioned 2018-10-19T14:10:43Z
dc.date.available 2018-10-19T14:10:43Z
dc.date.issued 2012-04-23
dc.identifier.citation Yan, F., Xing, G., Islam, M., Li, S., Lu, L. (2012): Orientation-dependent surface potential behavior in Nb-doped BiFeO3. Applied Physics Letters, 100 (17). DOI: 10.1063/1.4705405 en_US
dc.identifier.uri http://ir.ua.edu/handle/123456789/4055
dc.description.abstract Single-phase epitaxial Nb doped BiFeO3 (BFNO) films have been grown on diverse oriented-SrTiO3 substrates by pulsed laser deposition. The orientation dependent surface potential distributions arising from combination of the screen and polarization charges on the BFNO surfaces were characterized by Kelvin probe force microscopy combining with corresponding domain structures investigation using piezoresponse force microscopy. The relationship between surface potential and potential barrier was quantitatively analyzed through tuning the substrate orientation. The present study indicates that data stability and storage density can be controlled via engineering the substrate orientations. en_US
dc.format.mimetype application/pdf en_US
dc.subject Epitaxy en_US
dc.subject Kelvin probe force microscopy en_US
dc.subject Ferroelectric materials en_US
dc.subject Electric power en_US
dc.subject Thin films en_US
dc.subject Transition metal oxides en_US
dc.subject Potential energy barrier en_US
dc.subject Pulsed laser deposition en_US
dc.subject Piezoresponse force spectroscopy en_US
dc.subject Electrical properties and parameters en_US
dc.title Orientation-dependent surface potential behavior in Nb-doped BiFeO3 en_US
dc.type text en_US

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