Abstract:
Ferromagnetic resonance force microscopy (FMRFM) offers a means of performing local
ferromagnetic resonance. The authors have studied the evolution of the FMRFM force spectra in a
continuous 50 nm thick permalloy film as a function of probe-film distance and performed
numerical simulations of the intensity of the FMRFM probe-film interaction force, accounting for
the presence of the localized strongly nonuniform magnetic field of the FMRFM probe magnet.
Excellent agreement between the experimental data and the simulation results provides insight into
the mechanism of FMR mode excitation in a FMRFM experiment.
