Building practical apertureless scanning near-field microscopy

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dc.contributor Kung, Patrick
dc.contributor Yildirim, Abidin
dc.contributor.advisor Kim, Seongsin Gungordu, Muhammed Zeki 2018-06-04T14:57:17Z 2018-06-04T14:57:17Z 2017
dc.identifier.other u0015_0000001_0002824
dc.identifier.other Gungordu_alatus_0004M_13356
dc.description Electronic Thesis or Dissertation
dc.description.abstract The fundamental objective of this study is to establish a functional, practical apertureless type scanning near-field optical microscope, and to figure out the working mechanism behind it. Whereas a far-field microscope can measure the propagating field’s components, this gives us little information about the features of the sample. The resolution is limited to about half of the wavelength of the illuminating light. On the other hand, the a-SNOM system enables achieving non-propagating components of the field, which provides more details about the sample’s features. It is really difficult to measure because the amplitude of this field decays exponentially when the tip is moved away from the sample. The sharpness of the tip is the only limitation for resolution of the a-SNOM system. Consequently, the sharp tips are achieved by using electrochemical etching, and these tips are used to detect near-field signal. Separating the weak a-SNOM system signals from the undesired background signal, the higher demodulation background suppression is utilized by lock-in detection.
dc.format.extent 86 p.
dc.format.medium electronic
dc.format.mimetype application/pdf
dc.language English
dc.language.iso en_US
dc.publisher University of Alabama Libraries
dc.relation.ispartof The University of Alabama Electronic Theses and Dissertations
dc.relation.ispartof The University of Alabama Libraries Digital Collections
dc.relation.hasversion born digital
dc.rights All rights reserved by the author unless otherwise indicated.
dc.subject.other Nanotechnology
dc.subject.other Electromagnetics
dc.subject.other Optics
dc.title Building practical apertureless scanning near-field microscopy
dc.type thesis
dc.type text University of Alabama. Dept. of Electrical and Computer Engineering Electrical and Computer Engineering The University of Alabama master's M.S.

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