Nazaretski, E.; Thompson, J. D.; Movshovich, R.; Zalalutdinov, M.; Baldwin, J. W.; Houston, B.; Mewes, T.; Pelekhov, D. V.; Wigen, P.; Hammel, P. C.
We used magnetic resonance force microscopy (MRFM) to study a 50 nm thick continuous
Permalloy film. We mechanically measured the ferromagnetic resonance signal in the temperature
range between 10 and 70 K in the presence ...