Detection of Higher Order Modulation Harmonics in Magnetic Resonance Force Microscopy

Abstract

Magnetic resonance force microscopy measurements of the electron spin resonance of a thin film of 2,2-diphenyl-1-picrylhydrazyl were performed using a low doped silicon cantilever with a high coercivity SmCo particle glued to its end. The low doping level enables amplitude modulation of the microwave field with only small spurious driving of the cantilever. Besides amplitude modulation we use frequency modulation of the microwave field at integer fractions of the cantilever resonance frequency leading to derivative signals up to the fourth derivative of the amplitude modulation response signal. The influence of the modulation depth on the line shape of the first derivative response is also presented.

Description
Keywords
Linewidths, Doping, Magnetic resonance, Electron microscopy, Vibration resonance, Atomic line shapes, Frequency modulation, Electron paramagnetic resonance spectroscopy, Microwaves, Magnetic fields
Citation
Mewes, T., et al. (2007): Detection of Higher Order Modulation Harmonics in Magnetic Resonance Force Microscopy, Journal of Applied Physics, 102(3).